Hyman Hebert H. <br/><br/>
Secondary analysis of sample surveys :  principles procedures and potentialities. 

 - ed. 
 - New york :  John Wiley,  1972. 
 - 347  p. ;    cm. 
<br/><br/>index. 
<br/><br/><label>ISBN: </label> $ 
<br/><br/><label>Subjects--Topical Terms: </label><br/>social sciences.